Antoni Bukaluk: search on Z-Library

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1

Analysis of diffusion mechanisms in thin polycrystalline Au–Ag films using auger electron spectroscopy

Journal:

Surface and Interface Analysis

Year:

1983

Language:

english

File:

PDF, 683 KB

english, 1983

2

[Studies in Surface Science and Catalysis] Physics of Solid Surfaces 1984 Volume 23 || Determination of the Grain Boundary Diffusion Coefficients in Thin Film Au-Ag Couples by Auger Electron Spectroscopy

Bukaluk, Antoni

Year:

1985

Language:

english

File:

PDF, 82 KB

english, 1985

3

Interdiffusion studies in silver/palladium couples by means of Auger depth profiling

Antoni Bukaluk, Mikołaj Rozwadowski

Journal:

Year:

1995

Language:

english

File:

PDF, 431 KB

english, 1995

4

AES studies of interdiffusion in thin-film copper–palladium multilayer structures

Journal:

Year:

1999

Language:

english

File:

PDF, 111 KB

english, 1999

5

Determination of concentration-dependent diffusion coefficients in amorphous Ni-P films studied by auger electron depth profiling

Journal:

Czechoslovak Journal of Physics

Year:

1993

Language:

english

File:

PDF, 249 KB

english, 1993

6

Comparative aes studies of Cu diffusion through thin evaporated and ion-plated AgSn films

Journal:

Surface Science

Year:

1989

Language:

english

File:

PDF, 1.08 MB

english, 1989

7

AES depth profile studies of interdiffusion in thin polycrystalline Au-Ag multilayer films

Antoni Bukaluk, Wacław Bała

Journal:

Applied Surface Science

Year:

1990

Language:

english

File:

PDF, 555 KB

english, 1990

8

[Studies in Surface Science and Catalysis] Physics of Solid Surfaces 1987 Volume 40 || AES Studies of the Influence of Phosphorus Content on the Grain Boundary Diffusion of Cu Through NiP Electrochemical Layers

Bukaluk, Antoni

Year:

1988

Language:

english

File:

PDF, 307 KB

english, 1988

9

XPS Studies of the Initial Oxidation of Polycrystalline Rh Surface

Trzcinski, Marek, Balcerowska-Czerniak, GraÅ¼yna, Bukaluk, Antoni

Journal:

Year:

2020

File:

PDF, 2.55 MB

2020

10

THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINE Au-Ag MULTILAYER FILMS

BUKALUK, ANTONI

Journal:

Surface Review and Letters

Year:

1995

File:

PDF, 399 KB

1995

11

Auger electron spectroscopy studies of interdiffusion in electrodeposited amorphous NiP alloys

Journal:

Surface and Interface Analysis

Year:

1994

Language:

english

File:

PDF, 360 KB

english, 1994

12

Multivariate analysis to evaluate indium behavior at the copper phthalocyanine thin film

Balcerowska-Czerniak, Grażyna, Dittmar-Wituski, Adam, Hiller, Tomasz, Bukaluk, Antoni

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 1.64 MB

english, 2018

13

Comparative AES studies of Cu diffusion through thin evaporated and ion-plated Ag-Sn films

Journal:

Surface Science Letters

Year:

1989

Language:

english

File:

PDF, 53 KB

english, 1989

14

Determination of the activation energy of Ag diffusion through grain boundaries of thin Au films by using AES in a simplified accumulation method

Journal:

Applied Surface Science

Year:

1989

Language:

english

File:

PDF, 573 KB

english, 1989

15

Comparative AES studies of grain boundary diffusion in thin polycrystalline Ag/Pd, Au/Pd and Cu/Pd films

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 75 KB

english, 1999

16

Microstructure and Optical Properties of E-Beam Evaporated Zinc Oxide FilmsâEffects of Decomposition and Surface Desorption

Skowronski, Lukasz, Ciesielski, Arkadiusz, Olszewska, Aleksandra, Szczesny, Robert, Naparty, Mieczyslaw, Trzcinski, Marek, Bukaluk, Antoni

Journal:

Year:

2020

File:

PDF, 6.05 MB

2020

17

Influence of depth resolution on interdiffusion measurements in polycrystalline Cu/Pd multilayers

Journal:

Surface and Interface Analysis

Year:

2000

Language:

english

File:

PDF, 98 KB

english, 2000

18

In memoriam: Juliusz Karol Skonieczny

Journal:

Progress in Surface Science

Year:

1995

Language:

english

File:

PDF, 101 KB

english, 1995

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